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SnLayer - Thickness of tin layers

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SnLayer - Analyzer for thickness of tin layers
SnLayer - Analyzer for thickness
of tin layers

The thickness of the non-alloyed and alloyed tin layer on thin copper wires can be measured with high accuracy in a short duration by the electrochemical Analyzer SnLayer.

The coulometric determination of the thickness of the tin layer at the copper wires based on a newly developed procedure: the technique of voltammetry with a multiple potential-ramp.

The total amount of tin as well as the non-alloyed and the alloyed tin-part is detectable in only one measurement.


  • Determination of thickness of tin at copper wires
  • Determination of the non-alloyed and alloyed tin layer
  • Conductor board manufacture
  • Wire and cable manufacture
  • Quality management in rolling mills
  • Application in metal industry


  • Complete measurement system for the layer thickness of tin
  • Differentiation of non-alloyed and alloyed tin
  • Fast analysis
  • Typical duration: 8 min (non-alloyed and alloyed tin) < 2 min (non-alloyed tin)
  • According to the actual standard regulations
  • Automatic procedures
  • Customer-friendly handling
  • Pre-defined methods for selected wire-types
  • Generation of individual methods
  • Intuitive software
  • Comprehensive statistic module
  • Wide dynamic range for various wire-diameters and layer thickness
  • High precision of the analysis

Data sheet



ECH Elektrochemie Halle GmbH
Otto-Eißfeldt-Straße 8
06120 Halle (Saale)

Tel.: +49 345 279570-0
Fax: +49 345 279570-99
Mail: info@ech.de

Sales and Service Center UK

ECH Scientific Limited
Building 69, Wrest Park, Silsoe
Bedfordshire, MK45 4HS
United Kingdom

Tel.: +44 1525 404747
Fax: +44 1525 404848
Mail: info@ech.de

Visit us:


Show for the global
Laboratory & Analytical

24 - 26 October 2022
Hall S3, Stand 609